Statistics
Publications
15
Citations
843
H-Index
11
Active since
1998
Hyung-Ik Lee is an author at Samsung (South Korea) specializing in engineering, applied physics, and electrical engineering.
Publications per year
1998–2019
15
15
Bandgap measurement of thin dielectric films using monochromated STEM-EELS
Jucheol Park, Sung Heo, JaeGwan Chung et al. · Ultramicroscopy · 2009 · 99 citations
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