Katsuichi Kitagawa

Statistics

Publications

Citations

275

H-Index

Active since

2001

Affiliations

Toray Industries, Inc. (Japan)(Current)

Tokyo Institute of Technology

Toray (United States)

Yamaguchi University

Katsuichi Kitagawa is an author at Toray Industries, Inc. (Japan) specializing in optical interferometry, interferometric measurement, and interferometry.

ORCID

Publications per year

2001–2014

Publications

Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory

Akira Hirabayashi, Hidemitsu Ogawa, Katsuichi Kitagawa · Applied Optics · 2002 · 68 citations

Engineering, Mechatronics Engineering, Optics +15

Thin-film thickness profile measurement by three-wavelength interference color analysis

Katsuichi Kitagawa · Applied Optics · 2013 · 66 citations

Natural Sciences, Materials Engineering, Materials Science +17

Single-shot surface profiling by local model fitting

Masashi Sugiyama, Hidemitsu Ogawa, Katsuichi Kitagawa et al. · Applied Optics · 2006 · 30 citations

Engineering, Computer Science, Materials Engineering +13

Surface and thickness profile measurement of a transparent film by three-wavelength vertical scanning interferometry

Katsuichi Kitagawa · Optics Letters · 2014 · 30 citations

Natural Sciences, Materials Science, Metrology +16

Fast Surface Profiling by Multi-Wavelength Single-Shot Interferometry

Katsuichi Kitagawa · International Journal of Optomechatronics · 2010 · 28 citations

Engineering, Biomedical Engineering, Digital Imaging +14

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