Statistics
Publications
2
Citations
85
H-Index
2
Active since
1985
Affiliations
IBM (United States)(Current)
Jon R. Mandeville is an author at IBM (United States) specializing in computer vision, visual inspection systems, and inspection.
Publications per year
1985–2003
2
2
Algorithms for a fast confocal optical inspection system
A. Ravishankar Rao, N. Ramesh, Fangyu Wu et al. · 2003 · 14 citations
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