Joseph R. Michael

TEM Sample Preparation and FIB-Induced Damage

Joachim Mayer, Lucille A. Giannuzzi, Takeo Kamino et al. · MRS Bulletin · 2007 · 856 citations · Full text

Materials Science, Materials Engineering, Damage Mechanism +7

Automated Analysis of SEM X-Ray Spectral Images: A Powerful New Microanalysis Tool

Paul G. Kotula, Michael R. Keenan, Joseph R. Michael · Microscopy and Microanalysis · 2003 · 316 citations

X-ray Spectroscopy, Engineering, Microscopy +20

Solidification of Nb-bearing superalloys: Part I. Reaction sequences

John N. DuPont, Michael R. Notis, A. R. Marder et al. · Metallurgical and Materials Transactions A · 1998 · 200 citations

Materials Science, Materials Engineering, Engineering +6

Room-Temperature Voltage Tunable Phonon Thermal Conductivity via Reconfigurable Interfaces in Ferroelectric Thin Films

Jon F. Ihlefeld, Brian M. Foley, David Scrymgeour et al. · Nano Letters · 2015 · 166 citations · Full text

Materials Science, Electrical Engineering, Engineering +13

Lithographically Defined Three-Dimensional Graphene Structures

Xiaoyin Xiao, Thomas E. Beechem, Michael T. Brumbach et al. · ACS Nano · 2012 · 160 citations

Materials Science, Graphene Nanomeshes, Pore Structure +13