Concepedia

David Y. Lepejian

DY

Statistics

Publications

2

Citations

57

H-Index

2

Active since

1993

Affiliations

NEC (Japan)(Current)

David Y. Lepejian is an author at NEC (Japan) specializing in program analysis, computer engineering, and reliability engineering.

Top concepts

Publications per year

1993–2001

2

Publications

2

Using electrical bitmap results from embedded memory to enhance yield

J. Segal, A. Jee, David Y. Lepejian et al. · IEEE Design & Test of Computers · 2001 · 43 citations

, , +23

Automatic memory failure analysis using an expert system in conjunction with a memory tester/analyzer

T. Tsujide, Hiroyuki HAMADA, David Y. Lepejian et al. · 1993 · 14 citations

, , +29

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