Srinath R. Naidu

Use of neural networks for sensor failure detection in a control system

Srinath R. Naidu, Evanghelos Zafiriou, Thomas J. McAvoy · IEEE Control Systems Magazine · 1990 · 155 citations

Computing, Computer Science, Systems Engineering +17

Statistical timing for parametric yield prediction of digital integrated circuits

J.A.G. Jess, Kerim Kalafala, Srinath R. Naidu et al. · 2003 · 130 citations

Engineering, Computer Engineering, Electrical Engineering +13

Statistical timing for parametric yield prediction of digital integrated circuits

J.A.G. Jess, Kerim Kalafala, Srinath R. Naidu et al. · Proceedings of the 40th conference on Design automation - DAC '03 · 2003 · 47 citations

Engineering, Computer Engineering, Electrical Engineering +13

Statistical Timing for Parametric Yield Prediction of Digital Integrated Circuits

J.A.G. Jess, Kerim Kalafala, Srinath R. Naidu et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2006 · 31 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +13

Application of Neural Networks on the Detection of Sensor Failure During the Operation of a Control System

Srinath R. Naidu, Evanghelos Zafiriou, Thomas J. Mc Avoy · 1989 · 24 citations · Full text

Engineering, Computer Science, Systems Engineering +16