T. Quance

Oxygen evolution within barrier oxide films

E. Zhuravlyova, L. Iglesias-Rubianes, A. Pakes et al. · Corrosion Science · 2002 · 44 citations

Natural Sciences, Materials Engineering, Materials Science +14

Characterization of gadolinium and lanthanum oxide films on Si (100)

Xiaogang Wu, D. Landheer, G. I. Sproule et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2002 · 20 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +15

Factors affecting interface-state density and stress of silicon nitride films deposited on Si by electron-cyclotron resonance chemical vapor deposition

D. Landheer, K. Rajesh, Denis Masson et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1998 · 19 citations

Engineering, Materials Engineering, Materials Science +17

Structural comparison of gadolinium and lanthanum silicate films on Si(1 0 0) by HRTEM, EELS and SAED

Xiaohua Wu, D. Landheer, T. Quance et al. · Applied Surface Science · 2002 · 19 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +13

Formation of High‐Quality Nitrided Silicon Dioxide Films Using Electron‐Cyclotron Resonance Chemical Vapor Deposition with Nitrous Oxide and Silane

D. Landheer, Ye Tao, John Hulse et al. · Journal of The Electrochemical Society · 1996 · 17 citations

Natural Sciences, Materials Engineering, Materials Science +17