M. Reedyk

Technique for measuring the reflectance of irregular, submillimeter-sized samples

C. C. Homes, M. Reedyk, D. A. Cradles et al. · Applied Optics · 1993 · 360 citations

Natural Sciences, Materials Engineering, Materials Science +16

The low-temperature infrared optical functions of SrTiO3 determined by reflectance spectroscopy and spectroscopic ellipsometry

K. Kamarás, K.-L. Barth, F. Keilmann et al. · Journal of Applied Physics · 1995 · 129 citations · Full text

Natural Sciences, Materials Science, Physics +17

Infrared studies of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>ab</mml:mi></mml:math>-plane oriented oxide superconductors

T. Timusk, S. L. Herr, K. Kamarás et al. · Physical review. B, Condensed matter · 1988 · 114 citations

Natural Sciences, Materials Science, Physics +14

Kramers-Kronig-constrained variational dielectric fitting and the reflectance of a thin film on a substrate

D. A. Crandles, F. Eftekhari, Rudolf Faust et al. · Applied Optics · 2008 · 36 citations

Natural Sciences, Materials Engineering, Materials Science +17

Synthesis, characterization and superconducting properties of Pb2Sr2(Y/Ca)Cu3O9−δ single crystals

J. S. Xue, M. Reedyk, Yu-Chen Lin et al. · Physica C Superconductivity · 1990 · 36 citations

Natural Sciences, Materials Science, Physics +12