Jishun Kuang

Efficient March test algorithm for 1T1R cross‐bar with complete fault coverage

Peng Liu, Zhiqiang You, Jishun Kuang et al. · Electronics Letters · 2016 · 29 citations

Engineering, Computer Engineering, Electrical Engineering +17

Logic operation‐based Design for Testability method and parallel test algorithm for 1T1R crossbar

Peng Liu, Zhiqiang You, Jishun Kuang et al. · Electronics Letters · 2017 · 15 citations

Engineering, Computer Engineering, Electrical Engineering +16

Logic operation-based DFT method and 1R memristive crossbar March-like test algorithm

Peng Liu, Zhiqiang You, Jishun Kuang et al. · IEICE Electronics Express · 2015 · 11 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +15

An effective logic BIST scheme based on LFSR-reseeding and TVAC

Tieqiao Liu, Jishun Kuang, Shuo Cai et al. · International Journal of Electronics · 2013 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +13

A Novel BIST Scheme Using Test Vectors Applied by Circuit-under-Test Itself

Jishun Kuang, Xiong Ouyang, Zhiqiang You · 2008 · 10 citations

Engineering, Computer Engineering, Computer Science +13