Statistics
Publications
1
Citations
13
H-Index
1
Active since
2004
Affiliations
Texas Instruments (United States)(Current)
Lefei Zhang is an author at Texas Instruments (United States) specializing in package integrity testing, die design, and packaging engineering.
Publications per year
2004–2004
1
1
Die attach quality control of 3D stacked dies
M. Rencz, V. Székely, B. Courtois et al. · 2004 · 13 citations
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