Statistics
Publications
1
Citations
23
H-Index
1
Active since
2020
Affiliations
Intel (United States)(Current)
Kuljit Bains is an author at Intel (United States) specializing in device reliability, error detection, and fault tolerance.
Publications per year
2020–2020
1
1
Improving Memory Reliability by Bounding DRAM Faults
Kjersten Criss, Kuljit Bains, Rajat Agarwal et al. · 2020 · 23 citations
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