Yachen Kong

Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions

Yachen Kong, Meng Zhang, Xuepeng Zhan et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2020 · 31 citations

Non-volatile Memory, Electrical Engineering, Engineering +12

40nm Embedded Self-Aligned Split-Gate Flash Technology for High-Density Automotive Microcontrollers

D. Shum, Lai Q. Luo, Yachen Kong et al. · 2017 · 19 citations

Cmos Logic Process, Electrical Engineering, Engineering +14

Lateral charge migration induced abnormal read disturb in 3D charge-trapping NAND flash memory

Fei Wang, Rui Cao, Yachen Kong et al. · Applied Physics Express · 2020 · 18 citations

Non-volatile Memory, Electrical Engineering, Engineering +11

Temperature Impacts on Endurance and Read Disturbs in Charge-Trap 3D NAND Flash Memories

Fei Chen, Bo Chen, Hongzhe Lin et al. · Micromachines · 2021 · 15 citations · Full text

Non-volatile Memory, Engineering, Memory Design +20

Optimal Program-Read Schemes Toward Highly Reliable Open Block Operations in 3-D Charge-Trap NAND Flash Memory

Menghua Jia, Yachen Kong, Xuepeng Zhan et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2021 · 14 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +11