Tatjana Ulyanenkova

High-resolution x-ray diffraction investigation of relaxation and dislocations in SiGe layers grown on (001), (011), and (111) Si substrates

A. Zhylik, Andrey Benediktovich, A. Ulyanenkov et al. · Journal of Applied Physics · 2011 · 18 citations

Engineering, Silicon On Insulator, Detailed Characterization +16

Stress Gradient Analysis by Noncomplanar x-Ray Diffraction and Corresponding Refraction Correction

Andrei Benediktovitch, Tatjana Ulyanenkova, Jozef Kečkéš et al. · Advanced materials research · 2014 · 12 citations · Full text

Engineering, Stress Gradients, Mechanical Engineering +16

<i>Ab initio</i> simulation of diffractometer instrumental function for high-resolution X-ray diffraction

Alexander Mikhalychev, Andrei Benediktovitch, Tatjana Ulyanenkova et al. · Journal of Applied Crystallography · 2015 · 12 citations · Full text

X-ray Spectroscopy, Engineering, Electron Diffraction +24

Characterization of dislocations in germanium layers grown on (011)- and (111)-oriented silicon by coplanar and noncoplanar X-ray diffraction

Andrei Benediktovitch, A. Zhylik, Tatjana Ulyanenkova et al. · Journal of Applied Crystallography · 2015 · 11 citations · Full text

Bunches of misfit dislocations on the onset of relaxation of Si0.4Ge0.6/Si(001) epitaxial films revealed by high-resolution x-ray diffraction

Vladimir M. Kaganer, Tatjana Ulyanenkova, Andrei Benediktovitch et al. · Journal of Applied Physics · 2017 · 11 citations · Full text

Engineering, Dislocation Bunching, X-ray Diffraction Peaks +16