Concepedia

Adolf Strecker

AS

2

Publications

81

Citations

2

H-Index

1999

Active since

Affiliations

Max Planck Institute for Intelligent Systems(Current)

Adolf Strecker is an author at Max Planck Institute for Intelligent Systems specializing in applied physics, thin films, and microscopy.

Top concepts

MicroscopyThin FilmsEngineeringMicrostructureApplied PhysicsSurface ScienceMaterial ScienceCrystalline DefectsNanostructuringMicrofabrication

Publications per year

1999–2003

2

Publications

2

Progress in the Preparation of Cross-Sectional TEM Specimens by Ion-Beam Thinning

Adolf Strecker, Ute Bäder, Marion Kelsch et al. · Zeitschrift für Metallkunde · 2003 · 41 citations

Engineering, Transmission Electron Microscopy, Microscopy +17

Optimization of TEm specimen preparation by double-sided ion beam thinning under low angles

Adolf Strecker, Joachim Mayer, B. Baretzky et al. · Journal of Electron Microscopy · 1999 · 40 citations

Engineering, Microscopy, Ion Beam Instrumentation +19

Rows per page

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