T.M. Thomas

Scattered ion yields from 0.2 to 2 keV helium neutral or ion bombardment of solids

T.M. Thomas, Herschel Neumann, A. W. Czanderna et al. · Surface Science · 1986 · 41 citations

Engineering, Scattered Ion Yields, Physics +6

XPS and ISS of submonolayer coverage of Ag on SiO2

J. Roland Pitts, T.M. Thomas, A. W. Czanderna et al. · Applied Surface Science · 1986 · 39 citations

Electrical Engineering, Engineering, Applied Physics +2

Photoelectron spectroscopy of methyl, ethyl and isopropyl alcohol adsorbed on the (110) surface of Cu

Thomas A. Carlson, P. A. Agron, T.M. Thomas et al. · Journal of Electron Spectroscopy and Related Phenomena · 1981 · 37 citations

Materials Science, Surface Characterization, Photoelectron Spectroscopy +10

Exploratory corrosion tests on alloys in molten salts at 900 °C

R.T. Coyle, T.M. Thomas, G. Y. Lai · Journal of Materials for Energy Systems · 1986 · 26 citations

Materials Science, Engineering, Corrosion +7

Photoelectron spectroscopy of sulfur heterocycles adsorbed onto a Cu(110) surface

T.M. Thomas, Frederick A. Grimm, Thomas A. Carlson et al. · Journal of Electron Spectroscopy and Related Phenomena · 1982 · 18 citations

Surface Characterization, Engineering, Photochemistry +8