Statistics
Publications
1
Citations
38
H-Index
1
Active since
1976
Affiliations
NEC (Japan)(Current)
I. Nagasako is an author at NEC (Japan) specializing in device modeling, device degradation, and semiconductor devices.
Publications per year
1976–1976
1
1
Reliability Study of GaAs MESFET's
Takashi Irie, I. Nagasako, H. Kohzu et al. · IEEE Transactions on Microwave Theory and Techniques · 1976 · 38 citations
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