M. Nouf-Allehiani

Statistics

Publications

Citations

149

H-Index

Active since

2015

Affiliations

University of Strathclyde(Current)

University of Bath

Ferdinand-Braun-Institut

Technische Universität Berlin

University of Sheffield

M. Nouf-Allehiani is an author at University of Strathclyde specializing in semiconductor device materials, materials engineering, and semiconductor materials.

Publications per year

2015–2020

Publications

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films

Arantxa Vilalta‐Clemente, G. Naresh‐Kumar, M. Nouf-Allehiani et al. · Acta Materialia · 2016 · 59 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Electron channelling contrast imaging for III-nitride thin film structures

G. Naresh‐Kumar, David Thomson, M. Nouf-Allehiani et al. · Materials Science in Semiconductor Processing · 2016 · 28 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +14

Spatial clustering of defect luminescence centers in Si-doped low resistivity Al0.82Ga0.18N

Gunnar Kusch, M. Nouf-Allehiani, Frank Mehnke et al. · Applied Physics Letters · 2015 · 26 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films

C. Trager‐Cowan, Aeshah Alasmari, W Avis et al. · Photonics Research · 2019 · 13 citations · Full text

Engineering, Materials Engineering, Materials Science +16

Design and fabrication of enhanced lateral growth for dislocation reduction in GaN using nanodashes

E. D. Le Boulbar, J. Priesol, M. Nouf-Allehiani et al. · Journal of Crystal Growth · 2017 · 12 citations · Full text

Engineering, Materials Engineering, Materials Science +17

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