S. Schelz

Electronic and atomic structure of evaporated carbon films

S. Schelz, T. G. RICHMOND, P. Kania et al. · Surface Science · 1996 · 54 citations

Engineering, Carbon-based Material, Atomic Structure +4

Influence of a direct current bias on the energy of ions from an electron cyclotron resonance plasma

Petra Reinke, S. Schelz, W. Jacob et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1992 · 51 citations

Electrical Engineering, Engineering, Physics +14

Interface properties of hydrogenated amorphous carbon films on SiO2 and SiO1.2: an in situ photoelectron study

S. Schelz, P. Oelhafen · Surface Science · 1992 · 28 citations

Materials Science, Engineering, Oxide Electronics +8

Role of the surface roughness in laser induced crystallization of nanostructured silicon films

A. Hadjadj, Laïfa Boufendi, S. Huet et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2000 · 23 citations

Engineering, Silicon On Insulator, Plasma Duration +21

Characterization of diamond films deposited with a 915-MHz scaled-up surface-wave-sustained plasma

S. Schelz, C. Campillo, Michel Moisan · Diamond and Related Materials · 1998 · 23 citations

Engineering, Physics, Optical Properties +6