Statistics
Publications
1
Citations
21
H-Index
1
Active since
2018
Affiliations
R.V. College of Engineering(Current)
T. M. Saurab is an author at R.V. College of Engineering specializing in device characterization, metal-oxide-semiconductor field-effect transistor modeling, and gate oxide thickness effects.
Publications per year
2018–2018
1
1
1–1 of 1