Kurt Schweiger

Pulse Shape Measurements by On-Chip Sense Amplifiers of Single Event Transients Propagating Through a 90 nm Bulk CMOS Inverter Chain

Michael Hofbauer, Kurt Schweiger, Horst Dietrich et al. · IEEE Transactions on Nuclear Science · 2012 · 23 citations

Engineering, Computer Engineering, Electrical Engineering +11

An infrastructure for accurate characterization of single-event transients in digital circuits

Varadan Savulimedu Veeravalli, Thomas Polzer, Ulrich Schmid et al. · Microprocessors and Microsystems · 2013 · 19 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +16

Analogously tunable delay line for on-chip measurements with sub-picosecond resolution in 90 nm CMOS

Stefan Schidl, Kurt Schweiger, Wolfgang Gaberl et al. · Electronics Letters · 2012 · 12 citations

Engineering, Computer Engineering, Electrical Engineering +12

Supply Voltage Dependent On-Chip Single-Event Transient Pulse Shape Measurements in 90-nm Bulk CMOS Under Alpha Irradiation

Michael Hofbauer, Kurt Schweiger, Horst Zimmermann et al. · IEEE Transactions on Nuclear Science · 2013 · 11 citations

Engineering, Electrical Engineering, Physics +11

A 1GHz-GBW operational amplifier for DVB-H receivers in 65nm CMOS

Heimo Uhrmann, F. Schlögl, Kurt Schweiger et al. · 2009 · 10 citations

Engineering, Electrical Engineering, Low-power Design +16