7
Publications
189
Citations
7
H-Index
1992
Active since
Affiliations
Taylor Wimpey (United Kingdom)(Current)
Mike Conroy is an author at Taylor Wimpey (United Kingdom) specializing in instrumentation, engineering, and education.
Top concepts
EngineeringInstrumentationEducationMicroscopyCalibrationMeasurementInterferometryApplied PhysicsSurface MetrologySurface Topography
Publications per year
1992–2017
7
7
Guide to the measurement of smooth surface topography using coherence scanning interferometry.
Richard Leach, L. Brown, Xiangqian Jiang et al. · 2008 · 28 citations
Engineering, Measurement, Microscopy +20
Advances in thick and thin film analysis using interferometry
Mike Conroy · Wear · 2008 · 21 citations
Engineering, Physics, Microscopy +7
Mike Conroy, Daniel Mansfield · Nature Photonics · 2008 · 15 citations
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