Pi-Chun Juan

Fabrication and characterization of metal-ferroelectric (PbZr0.53Ti0.47O3)-Insulator (Y2O3)-semiconductor field effect transistors for nonvolatile memory applications

Wen-Chieh Shih, Pi-Chun Juan, Joseph Ya‐min Lee · Journal of Applied Physics · 2008 · 42 citations

Materials Science, Non-volatile Memory, Electrical Engineering +11

Impact of oxygen composition of ZnO metal-oxide on unipolar resistive switching characteristics of Al/ZnO/Al resistive RAM (RRAM)

Cheng‐Li Lin, Chi-Chang Tang, Shu-Ching Wu et al. · Microelectronic Engineering · 2015 · 41 citations

Materials Engineering, Materials Science, Electrical Engineering +10

Metal-ferroelectric (BiFeO3)-insulator (Y2O3)-semiconductor capacitors and field effect transistors for nonvolatile memory applications

Chih‐Ming Lin, Wen-Chieh Shih, Ingram Yin-ku Chang et al. · Applied Physics Letters · 2009 · 34 citations

Materials Science, Non-volatile Memory, Electrical Engineering +15

The charge trapping effect of metal-ferroelectric (PbZr0.53Ti0.47O3)-insulator (HfO2)-silicon capacitors

Pi-Chun Juan, Yuping Hu, Fu‐Chien Chiu et al. · Journal of Applied Physics · 2005 · 34 citations

Materials Science, Stress Voltage, Electrical Engineering +13

Interface characterization and current conduction in HfO2-gated MOS capacitors

Heying Chen, Fu‐Chien Chiu, C.H. Liu et al. · Applied Surface Science · 2008 · 34 citations

Electrical Engineering, Engineering, Bias Temperature Instability +3