Statistics
Publications
1
Citations
12
H-Index
1
Active since
2011
Affiliations
Georgia Institute of Technology(Current)
Ryan James is an author at Georgia Institute of Technology specializing in rfid performance evaluation, manufacturing engineering, and manufacturing simulation.
Publications per year
2011–2011
1
1
RFID testing and evaluation for an RF-harsh environment
A. J. Mercer, Ryan James, Gisele Bennett et al. · 2011 · 12 citations
Engineering, Manufacturing Engineering, Systems Engineering +12
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