L.M. Kaufman

An analysis of fault partitioned parallel test generation

J.M. Wolf, L.M. Kaufman, Robert H. Klenke et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1996 · 31 citations

Engineering, Computer Engineering, Computer Science +14

Workstation based parallel test generation

Robert H. Klenke, L.M. Kaufman, J.H. Aylor et al. · 2002 · 21 citations

Engineering, Computer Engineering, Computer Science +12

Modeling of common-mode failures in digital embedded systems

L.M. Kaufman, S. Bhide, B.W. Johnson · 2002 · 20 citations

Engineering, Computer Engineering, Systems Engineering +17

Coverage estimation using statistics of the extremes for when testing reveals no failures

L.M. Kaufman, B.W. Johnson, J.B. Dugan · IEEE Transactions on Computers · 2002 · 15 citations

Computing, Computer Systems, Systems Engineering +17

Using statistics of the extremes for software reliability analysis

L.M. Kaufman, J.B. Dugan, B.W. Johnson · IEEE Transactions on Reliability · 1999 · 14 citations

Computing, Computer Science, Software Engineering +14