T.-E. Dann

Raman spectrum of IrO2

Ying‐Sheng Huang, Sheng Lin, C.R. Huang et al. · Solid State Communications · 1989 · 90 citations

Physics, Optical Properties, Spectroscopy +5

Performance of the SRRC scanning photoelectron microscope

I.-H. Hong, T.-H. Lee, Gung-Chian Yin et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2001 · 52 citations

Materials Science, Engineering, Electron Microscopy +7

A high-performance double-crystal monochromator soft X-ray beamline

T.-E. Dann, Shih-Chun Chung, Liang-Jen Huang et al. · Journal of Synchrotron Radiation · 1998 · 43 citations · Full text

Materials Science, X-ray Spectroscopy, Engineering +12

Electronic and atomic structures of the Si-C-N thin film by x-ray-absorption spectroscopy and theoretical calculations

Y. K. Chang, H. H. Hsieh, W. F. Pong et al. · Physical review. B, Condensed matter · 1998 · 37 citations

X-ray-absorption Spectroscopy, Engineering, Si-c-n Thin Film +20

X-ray absorption of Si–C–N thin films: A comparison between crystalline and amorphous phases

Y. K. Chang, H. H. Hsieh, W. F. Pong et al. · Journal of Applied Physics · 1999 · 33 citations

Materials Science, Semiconductors, Edge Structure +15