Alexandra Delvallée

Author

Alexandra Delvallée

Laboratoire National de Métrologie et d'Essais ORCID

Also Known As

A Delvallée, A. DELVALLÉE, A. Delvallee, A. Delvallée, Alexandra DELVALLÉE, Alexandra Delvallee, Alexandra Delvallée, Delvallee, Alexandra, Delvallée, Alexandra

Publications

503

Citations

H-Index

Concepts

All Affiliations

Laboratoire National de Métrologie et d'Essais Centre National de la Recherche Scientifique Institut Pprime Commissariat à l'Énergie Atomique et aux Énergies Alternatives Danish National Metrology Institute

About

Alexandra Delvallée is an author at Laboratoire National de Métrologie et d'Essais specializing in engineering, applied physics, and microscopy.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	11	12	367
2	Applied Physics	8	8	258
3	Medicine	4	4	74
4	Education	1	1	33
5	Biomedical Engineering	1	1	26

Alexandra Delvallée

Publications

447

Citations

H-Index

Page 1

	Year	Citations
Direct comparison of AFM and SEM measurements on the same set of nanoparticles Alexandra Delvallée, Nicolas Feltin, S. Ducourtieux, Measurement Science and Technology NanoparticlesEngineeringIsolated NanoparticlesDirect ComparisonMicroscopy	2015	66
Deep Learning Based Instance Segmentation of Titanium Dioxide Particles in the Form of Agglomerates in Scanning Electron Microscopy Paul Monchot, Loïc Coquelin, Khaled Guerroudj, Nanomaterials Convolutional Neural NetworkMultiple Instance LearningEngineeringMachine LearningMicroscopy	2021	44
Size characterization of airborne SiO2 nanoparticles with on-line and off-line measurement techniques: an interlaboratory comparison study C. Motzkus, Tatiana Macé, François Gaie-Levrel, Journal of Nanoparticle Research Materials ScienceChemical EngineeringAir SamplingEngineeringNanomaterials	2013	38
Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology Loïc Crouzier, Alexandra Delvallée, S. Ducourtieux, Beilstein Journal of Nanotechnology EngineeringNanoparticle Dimensional MetrologyMicroscopyMechanical EngineeringHybrid Metrology	2019	37
Setup of a high-precision profilometer and comparison of tactile and optical measurements of standards H. Nouira, J-A Salgado, N El-Hayek, Measurement Science and Technology EngineeringMeasurementOptical TestingMechanical EngineeringInterferometry	2014	33
Deep-reactive ion etching of silicon nanowire arrays at cryogenic temperatures Jiushuai Xu, Andam Deatama Refino, Alexandra Delvallée, Applied Physics Reviews EngineeringNanodevicesSi NanowiresSilicon Nanowire ArraysIntegrated Circuits	2024	33
Toward an uncertainty budget for measuring nanoparticles by AFM Alexandra Delvallée, Nicolas Feltin, S. Ducourtieux, Metrologia NanoparticlesMean DiameterEngineeringMicroscopySio2 Nps	2015	26
A new method for measuring nanoparticle diameter from a set of SEM images using a remarkable point Loïc Crouzier, Alexandra Delvallée, S. Ducourtieux, Ultramicroscopy Nanoparticle DiameterEngineeringNp ContourMicroscopyBiomedical Engineering	2019	26
Anomalous dissipation mechanism and Hall quantization limit in polycrystalline graphene grown by chemical vapor deposition F. Lafont, Rebeca Ribeiro-Palau, Zheng Han, Physical Review B	2014	24
Methodology to evaluate the uncertainty associated with nanoparticle dimensional measurements by SEM Loïc Crouzier, Alexandra Delvallée, Alexandre Allard, Measurement Science and Technology	2019	20

Page 1