Statistics
Publications
1
Citations
38
H-Index
1
Active since
2017
Affiliations
General Electric (United States)(Current)
Jeffrey Erlbaum is an author at General Electric (United States) specializing in device reliability, microelectronics, and gate oxide degradation.
Publications per year
2017–2017
1
1
SiC MOSFET design considerations for reliable high voltage operation
P. A. Losee, Alexander Bolotnikov, Lihua Yu et al. · 2017 · 38 citations
Engineering, Electrical Engineering, Electronic Materials +12
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