Study of in-situ degradation of thermal control surfaces

J. E. Gilligan, G. A. Zerlaut

NASA STI Repository (National Aeronautics and Space Administration) · 1972 · 34 citations · 0 references

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Abstract

Experimental technique used in study of damage mechanism to semiconductor pigments exposed to ultraviolet radiation can be adapted for investigations of surface chemistry and may be used analytically to determine contamination.