Colorimetric characterization of the Apple studio display (Flat panel LCD)

Mark D. Fairchild, David R. Wyble

RIT Scholar Works (Rochester Institute of Technology) · 1998 · 57 citations · 1 references

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Abstract

The colorimetric characterization of a flat-panel LCD monitor, the Apple Studio Display, using traditional CRT characterization techniques was evaluated. The results showed that the display performed up to the manufacturer's specifications in terms of luminance and contrast. However, the traditional CRT gain-offset-gamma (GOG) model for characterization was inadequate and a model with one-dimensional lookup tables followed by a 3x3 matrix was developed. The LUT model performed excellently with average CIE94 color differences between measured and predicted colors of approximately 1.0.

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