Journal of Electronic Materials · 2015 · 21 citations · 8 references
Natural SciencesMaterials EngineeringMaterials ScienceOptical MaterialsOptoelectronicsPhotonicsInfrared DetectorsInfrared Optical MaterialsInfrared SpectroscopyOptical Transfer FunctionPhotonic Device SimulationCadmium TellurideFinite Element ModelingMercury Cadmium TellurideModulation Transfer FunctionNondestructive AnalysisOptical Transfer Function ModelingSpectral Response CharacterizationSpectral Response Modeling
Space‑borne infrared systems demand high performance across the full SWIR–VLWIR spectrum, a capability enabled by advanced mercury‑cadmium‑telluride technology but requiring deep physical insight for optimization. The study computes spectral response and modulation transfer function using finite‑element modeling and demonstrates nondestructive MTF measurement at a 10 µm pitch. Mercury‑cadmium‑telluride’s tunable bandgap enables operation across SWIR–VLWIR, and the authors use finite‑element modeling to compute spectral response and MTF, including a nondestructive small‑pitch measurement technique. The simulations accurately predict performance across all IR bands, confirming the state‑of‑the‑art status of the technology and its agreement with theory.
Space applications are challenging infrared (IR) technologies, demanding the best system performance achievable. This requires covering the entire IR spectrum from short-wavelength infrared (SWIR) to very long-wavelength infrared (VLWIR) for various pixel sizes, which is possible thanks to a well-mastered mercury cadmium telluride technology. Because of its adjustable gap, it can be operated in all the IR bands. Nevertheless, technology optimization requires deep understanding of physical mechanisms. This paper presents computations by finite-element modeling of two aspects of electrooptical performance: spectral response and modulation transfer function (MTF). Computations and characterizations for all IR bands demonstrate the accuracy of our simulations and the state-of-the-art nature of our technology, which performs according to theory. This paper also highlights the capability to measure MTF at very small pitch (10 μm) by a nondestructive method.
8
Infrared detector size: how low should you go?
Ronald G. Driggers · Optical Engineering · 2012 · 83 citations
Detailed study of above bandgap optical absorption in HgCdTe
K. Moazzami, Jamie Phillips, D. Lee et al. · Journal of Electronic Materials · 2005 · 51 citations
Natural Sciences, Materials Engineering, Materials Science +12