Characterization of yttria-stabilized zirconia thin films deposited by electron beam evaporation on silicon substrates

M. Hartmanová, I. Thurzo, M. Jergel, J Bartoš, F. Kadlec, V. Železný, Daniel Tunega, František Kundracík, Š. Chromík, M. Brunel

Journal of Materials Science · 1998 · 33 citations · 13 references

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