Imaging of an Active NANOR -type LANR Component using CR-39

Abstract

This effort examined CR-39 chips exposed to a ZrO2-PdD NANOR⃝R -type CF/LANR component exhibiting significant energy. There was a fall-off in pit count with increasing distance from the operating system. Most interestingly, the CR-39 over the device essentially imaged the active CF/LANR device at very low resolution. Large tracks were the most effective for imaging. Smaller and mid-sized tracks appear to be useful for measuring fall off of the chip irradiation as a function of distance. The conclusion is that CF/LANR is a nuclear process, and for this system at this power level, the quantitative amount is measurable in a spatial, controllable, pattern.