Publication | Closed Access
Competing behavior of interface delamination and wafer cracking during peeling film from ultra-thin wafer
19
Citations
42
References
2024
Year
Materials ScienceInterface DelaminationWafer Scale ProcessingWafer CrackingEngineeringMechanical EngineeringApplied PhysicsElectronic PackagingMicroelectronicsSurface ProcessingMechanics Of MaterialsThin Film ProcessingUltra-thin Wafer
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