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Electrical and dielectric characterization of Ge quantum dots embedded in MIS structure (AuPd/SiO2:Ge QDs/n-Si) grown by MBE

Materials ScienceGe Quantum DotsEngineeringPhysicsNanoelectronicsNanotechnologyApplied PhysicsQuantum DotsSemiconductor NanostructuresSemiconductor MaterialMolecular Beam EpitaxyDielectric CharacterizationOptoelectronicsCompound SemiconductorMis Structure