Publication | Closed Access
Assessment of the complete chain evolution process of LIBs from micro internal short circuit failure to thermal runaway under mechanical abuse conditions
43
Citations
33
References
2024
Year
Materials ScienceEngineeringMechanical Abuse ConditionsEngineering Failure AnalysisThermodynamicsElectronic PackagingMechanics Of MaterialsPhysic Of Failure
| Year | Citations | |
|---|---|---|
Page 1
Page 1