ACS Applied Materials & Interfaces · 2024 · 21 citations · 24 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsOptoelectronicsSemiconductor DevicesOptoelectronic MaterialsPhotodetectorsPhotovoltaic DevicesSemiconductor Device MaterialsSemiconductor HeterostructuresTwo-dimensional SemiconductorsAnisotropyBand GapPhotodetectionPolarizationPolarization SensitivityPolarization-sensitive DetectorsTwo-dimensional MaterialsType-ii Heterostructures
Polarization-sensitive photodetectors based on two-dimensional anisotropic materials still encounter the issues of narrow spectral coverage and low polarization sensitivity. To address these obstacles, anisotropic As 0.6 P 0.4 with a narrow band gap has been integrated with WSe 2 to construct a type-II heterostructure, realizing a high-performance polarization-sensitive photodetector with broad spectral range from 405 to 2200 nm. By operating in photovoltaic mode at zero bias, the device shows a very low dark current of ∼0.02 picoampere, high responsivity of 492 m A/W, and high photoswitching ratio of 6 × 10 4, yielding a high specific detectivity of 1.4 × 10 12 Jones. The strong in-plane anisotropy of As 0.6 P 0.4 endows the device with a capability of polarization-sensitive detection with a high polarization ratio of 6.85 under a bias voltage. As an image sensor and signal receiver, the device shows great potential in imaging and optical communication applications. This work develops an anisotropic vdW heterojunction to realize polarization-sensitive photodetectors with wide spectral coverage, fast response, and high sensitivity, providing a new candidate for potential applications of polarization-resolved electronics and photonics.
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