Machine Learning Techniques for Predicting Metamaterial Microwave Absorption Performance: A Comparison

Abstract

This work presents a metamaterial absorber (MMA) for X- and Ku-bands with a metallic resonating patch on top and a ground plane separated by substrate FR-4 with a thickness of 0.053 λ at the lowest resonance frequency. The proposed MMA demonstrates perfect absorption of 99.42, 98.48, 98.92, and 99.34 % at 9.948, 13.26, 14.92, and 15.80 GHz, respectively at normal incidence. The proposed MMA demonstrates perfect absorption for a polarization and incident angle over a wide range of angles up to 45°. To understand the fundamental EM behavior of the metamaterial structure, equivalent circuit analysis was carried out, and the circuit outputs accorded with the simulation results. This article also compares various machine learning (ML) methods for optimizing the design and predictive modeling of MMAs, such as decision trees, K-nearest neighbors, random forests, extra trees (ET), bagging, LightGBM, XGBoost, hist gradient boosting, cat boost, and gradient boosting regressors. The primary objective is to assess the usefulness of each regressor technique in estimating the performance of MMAs using multiple tests ranging from TC-40 to TC-80 and performance metrics such as adjusted R-squared score, MSE, RMSE, and MAE, in which the ET regressor excels. Simulation results suggest that ML-based techniques can save simulation resources and time while still being an efficient tool for predicting absorber behavior at intermediate and subsequent frequencies.