Engineering Failure Analysis · 2023 · 32 citations · 33 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsCreep BehaviorCreep DeformationDevice ReliabilitySemiconductor ReliabilitySinteringThermal Properties Of MaterialsCreep Under Thermal LoadingFatigue FailureFatigue Failure AnalysisFatigue Failure CriteriaSilicon Carbide (Sic) MaterialsThermal CreepThermal Cycling ReliabilityThermal Fatigue
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From classical thermodynamics to phase-field method
Long‐Qing Chen, Yuhong Zhao · Progress in Materials Science · 2021 · 393 citations · Full text
John G. Bai, Ziyang Zhang, Jesus N. Calata et al. · IEEE Transactions on Components and Packaging Technologies · 2006 · 370 citations