Detecting abnormal behavior of automatic test equipment using autoencoder with event log data - Concepedia

Concepedia

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Detecting abnormal behavior of automatic test equipment using autoencoder with event log data

11

Citations

39

References

2023

Year

Young-Mok Bae, Young-Gwan Kim, Jeong-Woo Seo, Hyun‐A Kim, Chang-Ho Shin, Jeonghwan Son, Gyuho Lee, Kwang-Jae Kim

Computers & Industrial Engineering

References

	Year	Citations

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