Leaf Disease Detection in Crops based on Single-Hidden Layer Feed-Forward Neural Network and Hierarchal Temporary Memory

Kanahaiya Lal Ambashtha, Deepak Kumar Awasthi, Arvind Kumar Shukla, S. Ragamayi, Mathur Nadarajan Kathiravan, Amit Chauhan

2023 · 10 citations · 21 references

Concepts

Abstract

Insects, mites, and fungi are common causes in plant disease, which can significantly reduce yields if not addressed promptly. Farmers are losing money as a result of crop illnesses. As the average under cultivation increases, it becomes more of a burden for farmers to keep an eye on everything. In this study, the median filter is used as a preprocessing step to transform the input image into a grayscale representation which used YCbCr color space. Otsu's segmentation is used to divide photographs that contain bright items on a dark background. Feature extraction using Grey Level Co-occurrence Matrix (GLCM). The proposed technique, known as ELM-HTM combines a simple yet adaptable extreme learning machine (ELM) with a Hierarchical Temporal Memory (HTM). This approach outperforms the ELM and HTM model with an accuracy of about 98.8%.

References

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