Analog Resistive Switching and Artificial Synaptic Behavior of ITO/WOX/TaN Memristors

Abstract

In this work, we fabricated an ITO/WO_X/TaN memristor device by reactive sputtering to investigate resistive switching and conduct analog resistive switching to implement artificial synaptic devices. The device showed good pulse endurance (10⁴ cycles), a high on/off ratio (>10), and long retention (>10⁴ s) at room temperature. The conduction mechanism could be explained by Schottky emission conduction. Further, the resistive switching characteristics were performed by additional pulse-signal-based experiments for more practical operation. Lastly, the potentiation/depression characteristics were examined for 10 cycles. The results thus indicate that the WO_X-based devices are appropriate candidates for synaptic devices as well as next-generation nonvolatile memory.