Control-enhanced quantum metrology under Markovian noise

Abstract

Quantum metrology is supposed to significantly improve the precision of parameter estimation by utilizing suitable quantum resources. However, the predicted precision can be severely distorted by realistic noises. Here, we propose a control-enhanced quantum metrology scheme to defend against these noises to improve the metrology performance. Our scheme can automatically alter the parameter-encoding dynamics with adjustable controls, thus leading to optimal resultant states that are less sensitive to the noises under consideration. As a demonstration, we numerically apply it to the problem of frequency estimation under several typical Markovian noise channels. By comparing our control-enhanced scheme with the standard scheme and the ancilla-assisted scheme, we show that our scheme performs better and can improve the estimation precision up to around one order of magnitude. Furthermore, we conduct a proof-of-principle experiment in a nuclear magnetic resonance system to verify the effectiveness of the proposed scheme. The research here is helpful for current quantum platforms to harness the power of quantum metrology in realistic noise environments.