ToF-SIMS investigation with 18O isotopic tracer of the ion transport mechanisms in surface oxides on nickel-chromium and nickel-chromium-molybdenum alloys - Concepedia

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ToF-SIMS investigation with 18O isotopic tracer of the ion transport mechanisms in surface oxides on nickel-chromium and nickel-chromium-molybdenum alloys

18

Citations

32

References

2022

Year

Antoine Seyeux, Zuocheng Wang, Sandrine Zanna, Charly Carrière, Dimitri Mercier, Philippe Marcus

Electrochimica Acta

Isotopic TracerEngineeringIon Transport MechanismsOxide ElectronicsSurface ScienceApplied PhysicsTof-sims InvestigationChemistryElemental Metal

References

	Year	Citations

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