Minimum Quantum Run-Time Characterization and Calibration via Restless Measurements with Dynamic Repetition Rates

Abstract

Qubit calibration and characterization are important for attaining high-fidelity gates in quantum computing, but require a significant amount of time, which limits a device's ability to run useful quantum circuits. This study uses restless measurement, in which the qubits are never reset, to speed up characterization and calibration tasks. The authors also show how quantum process tomography may be performed in a restless setting. This approach reduces the footprint of characterization and calibration on quantum processors by quickly and faithfully executing the corresponding circuits.