Fast Fault Diagnosis in Industrial Embedded Systems Based on Compressed Sensing and Deep Kernel Extreme Learning Machines

Abstract

With the complexity and refinement of industrial systems, fast fault diagnosis is crucial to ensuring the stable operation of industrial equipment. The main limitation of the current fault diagnosis methods is the lack of real-time performance in resource-constrained industrial embedded systems. Rapid online detection can help deal with equipment failures in time to prevent equipment damage. Inspired by the ideas of compressed sensing (CS) and deep extreme learning machines (DELM), a data-driven general method is proposed for fast fault diagnosis. The method contains two modules: data sampling and fast fault diagnosis. The data sampling module non-linearly projects the intensive raw monitoring data into low-dimensional sampling space, which effectively reduces the pressure of transmission, storage and calculation. The fast fault diagnosis module introduces the kernel function into DELM to accommodate sparse signals and then digs into the inner connection between the compressed sampled signal and the fault types to achieve fast fault diagnosis. This work takes full advantage of the sparsity of the signal to enable fast fault diagnosis online. It is a general method in industrial embedded systems under data-driven conditions. The results on the CWRU dataset and real platforms show that our method not only has a significant speed advantage but also maintains a high accuracy, which verifies the practical application value in industrial embedded systems.