IEEE Transactions on Electromagnetic Compatibility · 1988 · 59 citations · 14 references
EngineeringFar-field MeasurementMeasurementDual Tem CellEducationElectromagnetic CompatibilityRadiation ProtectionPt.i See Ibid.Computational ElectromagneticsElectromagnetic Shielding EffectivenessInstrumentationEmi MeasurementNear-field Source SimulationElectromagnetic WaveMagnetic ShieldingElectrical EngineeringPhysicsMicrowave MeasurementMicrowave EngineeringHigh-frequency MeasurementTransmission LineNear-field SourceNear-field MeasurementElectrical Insulation
For pt.I see ibid., vol.30, no.3, p.239-50 (1988). Measurements of electromagnetic shielding effectiveness of materials by simulating a near-field source are further discussed. Two specific measurement approaches, the use of a dual TEM cell and the application of an apertured TEM cell in a reverberating chamber, are studied. For each case, the system frequency range, test sample requirements, test field type, dynamic range, measurement time required, and analytical background, are considered, and data taken on a common set of materials are presented.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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