Critical layer thicknesses for inclined dislocation stability in multilayer structures

Abstract

The critical thickness for stability of dislocations on glide planes inclined to the interfaces in a strained-layer structure is derived. Results are presented for both a single embedded layer and a multilayer structure (superlattice). Both the equilibrium array for the complete removal of coherency strain and less-dense arrays are considered. Results are compared with the previous treatment of Lomer misfit dislocations and with other treatments of multiple dislocation arrays.