Advanced Materials · 2000 · 15 citations · 0 references
Natural SciencesMaterials SciencePhysicsMaterials CharacterizationNanomaterialsNanotechnologyCarbon NanotubesElectrical CharacterizationNanomaterial CharacterizationNanoscale MaterialsNanowiresTransmission Electron MicroscopyCarbon Nanotube CharacterizationCarbon Nanotube Mechanical PropertiesElectrical PropertiesField EmissionIn Situ Transmission Electron MicroscopyMechanical Properties Of NanowiresNanowire CharacterizationSemiconductor Nanowires
A new approach to the characterization of the mechanical and electrical properties of individual nanowires and nanotubes is demonstrated by in-situ transmission electron microscopy (TEM). The technique allows a one-to-one correlation between the structure and properties of the nanowires. Recent developments include the determination of the Young's modulii of carbon nanotubes and semiconductor nanowires, femtogram nanobalance of a single fine particle, field emission of carbon nanotubes, and quantum ballistic conductance in carbon nanotubes.