Publication | Closed Access

Energy loss of warm electrons at the interface of (100) silicon MOSFETS

Electrical EngineeringEngineeringWarm ElectronsSilicon MosfetsBias Temperature InstabilityApplied PhysicsSemiconductor Device FabricationThermodynamicsHeat TransferElectronic PackagingMicroelectronicsThermal EngineeringEnergy LossSilicon On InsulatorSemiconductor Device