Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM - Concepedia

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Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM

34

Citations

36

References

2022

Year

S. Tōyama, Takehito Seki, Yuya Kanitani, Yoshihiro Kudo, Shigetaka Tomiya, Yuichi Ikuhara, Naoya Shibata

Ultramicroscopy

SemiconductorsElectrical EngineeringEngineeringPhysicsDpc StemSemiconductor HeterostructuresApplied PhysicsMultilayer HeterostructuresSemiconductor Device

References

	Year	Citations

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